Portable Research Grade Atomic Force Microscope
Portable Research Grade Atomic Force Microscope
- Educational Scanning Probe Microscope
- Contact & non-Contact Modes
- 1nm X &Y Axis Resolution
- 1nm Z Axis Resolution
Description & Specification
Portable Research Grade Scanning Probe Microscope Standard Version Mode: Contact & non-Contact Modes XY Scanner: 30µm Maximum XY Scan Range 1nm XY Resolution Z Scanner: 2µm Z Scan Range 1nm X Resolution AFM Unit Dimension 300mm x 400 mm x 300 mm Net Weight 20 Kg
